Laboratory capacity of semiconductor and application solutions：
1. Test and analysis of reverse recovery time, forward surge, VF, VB, IR and other parameters of diode and bridge stack
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| Reverse recovery time tester | Multifunctional basic performance tester for diode and Bridge | Diode and bridge basic performance tester |
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| Temperature VF / temperature IR test system | Intermittent / continuous power aging test |
Objective: Based on the concept of "openness, integration, practice and innovation", the laboratory is mainly used for performance evaluation, failure analysis and reliability verification of application circuits of semiconductor devices, so as to realize the initial intention of selecting components. We believe that with the construction of the public laboratory built by our company and the specialized research and exploration of semiconductor devices, we will be able to realize the development strategy centered on customer demand and make a contribution to the product control of customers.
Service reception:
You can choose one of the following two ways: After the demand is submitted, a special person will contact and communicate the service details within one working day.
1. On-site test: make an appointment to go to the Yuejiahong shared laboratory in Shenzhen, accompanied by senior technical experts, and use relevant instruments and components for on-site test.
2. On-line test: make an appointment for mailing, and conduct on-line remote test. Technical experts will help you complete the test through telephone and other means, and feed back relevant test results.
Appointment process:
Submit an appointment application and wait for review-the staff will confirm the relevant matters with you-the review is passed, and you will be notified by SMS or email-you can use the laboratory by SMS or email.
Laboratory address: 4th floor, Building 3, A Park, COFCO Xin 'an Industrial Park, Honglang North Second Road, Baoan District, Shenzhen.
Contact person: inch worker
Tel: 18665379597
